Characterization of Clay Deposits in Lafia and Doma, Part of the Middle Benue Trough, North Central Nigeria: Implications for Industrial Applications
Ahmad Ibrahim Aliyu, Lucy Ooja Agho, Muhammad Sanusi Idris, Usman Shehu Saeed, Fatima Adamu Idris, Beatrice Imona Amos, Sheriff Abdulrafiu
Published on June 27th, 2026

Abstract

Clay deposits in the Middle Benue Trough have received limited attention compared to petroleum and metallic mineral resources, despite their industrial relevance. This study presents a comparative mineralogical, geochemical, and geotechnical characterization of clay deposits in Lafia and Doma, North Central Nigeria, to evaluate their industrial potential. Representative samples were analyzed using X-ray fluorescence for major oxides, X-ray diffraction with Rietveld refinement for mineral quantification, and standard geotechnical tests for particle size distribution and plasticity. The clays are mostly kaolinitic, with an average kaolinite content of 42.0 wt% and a quartz content of 38.25 wt%. Major oxide composition is dominated by SiO2 and Al2O3, with mean Al2O3 values higher in Lafia samples. Chemical Index of Alteration values above 89 indicate intense weathering of the source materials. Particle size analysis shows dominant fine fractions, and plasticity tests classify Doma clays as moderately plastic and Lafia clays as highly plastic inorganic clays. Comparison with reported industrial compositional ranges suggests that the clays possess favorable characteristics for ceramic products such as tiles, bricks, and stoneware, while Lafia clays compare well with reported compositional requirements for cement raw feed or calcined clay applications. Elevated Fe2O3 contents may limit direct use in high-grade paint applications without further processing. The study provides baseline mineralogical and geochemical data for industrial screening of clay resources in the Middle Benue Trough and establishes a foundation for further performance-based testing.

Keywords

Clay deposits
Geochemical
Mineralogical
Industrial applications
X-ray diffraction
X-ray fluorescence

License

This is an open access article distributed under the terms of the Creative Commons Attribution License 4.0 (CC BY 4.0).